RyanJones

Features IEEE-1149.6 AC-coupled testing, automatic vector generation, and In-System Programming. Cerritos, CA, October 4, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. The USB-1149.1/CFM is...

Corelis JTAG Embedded Test (JET) reduces test time, adds non-intrusive functional test. Cerritos, CA, May 9, 2011 – Corelis, Inc., a leading supplier of high-performance JTAG test and measurement tools, announced today the successful integration and deployment of the ScanExpress JTAG Embedded Test (JET) functional test system at the production facilities of QSC Audio Products, LLC in Costa Mesa...

New Tool Offers Complete Structural and Functional Test Solutions for Reference Designs.